Alberto Herrera-Gomez

  • Professor of Materials Science.  CINVESTAV-México (1994-to date).

  • Chairman of the ASTM Subcommittee on XPS (E42.03) (July 2021-to date).

  • Premio “Francisco Javier Espinoza Beltrán” (Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales, 2019) “Por sus contribuciones pioneras en el campo de la espectroscopia fotoelectrónica de rayos X (XPS), en particular en el mejoramiento de la técnica de análisis y adquisición de datos, y por la formación de una escuela de XPS en México”.

  • Fellow of the American Vacuum Society “For his seminal contributions to developing quantitative surface analysis, especially for XPS” (2016).

  • First Vice Chairman of the E42 Committee (Surface Analysis) of the ASTM (2009-to date). 

  • Chairman of the surface analysis Terminology Subcommittee of the ASTM (2008-to date).

  • Member of the Advisory Board of the Surface and Interface Analysis journal (2015 to date).

  • Secretary of the Applied Surface Science Division (2010-2013) of the International Union for Vacuum Science and Technology (IUVSTA). 

  • Member at Large of the Applied Surface Science Division of the American Vacuum Society (2007-2011). 

  • “Daniel Schechtman” Chair. Universidad Autónoma Metropolitana (2012-2013).

  • President of the Mexican Vacuum Society (2002-2004). 

  • Visiting Professor, University of Texas at Dallas (2005-2007).

  • 100+ papers, 1500+ citations, h-index 25. Graduate students: 11 Ph.D, 15 M.S., 1 B.D.


Education:

  • Postdoctoral (Electrical Engineering). Stanford University, 1994.

  • Ph.D. (Applied Physics). Stanford University, 1994.

  • M.S. (Applied Physics). Stanford University, 1991.

  • M.S (Physics). CINVESTAV, 1988.

  • Bachelor (Physics). Universidad Autónoma Metropolitana, 1985.



Current Main Research Topics:

  • Physical origin of the background signal in XPS data.

  • XPS data analysis and data acquisition

  • Early stages of the oxidation of transition metals.

  • Mass transport in multilayered nanofilms.

  • Development of international standards:

    • “Group Leader” in the International Standardization Organization (ISO/TC201:SC7), for the development of a standard for the assessment of the background signal in XPS data. 

    • “Technical Contact”, in the ASTM-E42 committee for the revision of the standard about the background signal in XPS data.